Call for Paper PAA Journal

[espaa]

                                    CALL FOR PAPERS

           PATTERN ANALYSIS AND APPLICATIONS journal

                   http://www.soc.plym.ac.uk/soc/sameer/paa.htm

                                 Springer-Verlag Limited

Springer Verlag Ltd is launching a new journal - Pattern Analysis and
Applications (PAA) - in Spring 1998. Original Papers are now invited
for the journal covering the following areas of interest:

     Aims and Scope of PAA:

     The journal publishes high quality articles in areas
     of fundamental research in pattern analysis and applications. It
     aims to provide a forum for original research which describes
     novel pattern analysis techniques and industrial applications of
     the current technology. The main aim of the journal is to publish
     high quality research in intelligent pattern analysis in computer
     science and engineering. In addition, the journal will also
     publish articles on pattern analysis applications in medical
     imaging. The journal solicits articles that detail new technology
     and methods for pattern recognition and analysis in applied
     domains including, but not limited to, computer vision and image
     processing, speech analysis, robotics, multimedia, document
     analysis, character recognition, knowledge engineering for
     pattern recognition, fractal analysis, and intelligent control.
     The journal publishes articles on the use of advanced pattern
     recognition and analysis methods including statistical
     techniques, neural networks, genetic algorithms, fuzzy pattern
     recognition, machine learning, and hardware implementations which
     are either relevant to the development of pattern analysis as a
     research area or detail novel pattern analysis applications.
     Papers proposing new classifier systems or their development,
     pattern analysis systems for real-time applications, fuzzy and
     temporal pattern recognition and uncertainty management in
     applied pattern recognition are particularly solicited.

     The journal encourages the submission of original case-studies on
     applied pattern recognition which describe important research in
     the area. The journal also solicits reviews on novel pattern
     analysis benchmarks, evaluation of pattern analysis tools, and
     important research activities at international centres of
     excellence working in pattern analysis.

     Audience:
     Researchers in computer science and engineering. Research and
     Development Personnel in industry. Researchers/ applications
     where pattern analysis is used, researchers in the area of novel
     pattern recognition and analysis techniques and their specific
     applications.

________________________________________________________________    
Editorial Board:
Sukhan  Lee	 University of Southern California, USA
Eric Saund	          Xerox Palo Alto Research Center, USA 
Narendra Ahuja	 University of Illinois - Urbana Champaign, USA 
Andras Lorincz    University of Szeged, Hungary 
William Freeman	 Mitsubishi Electric Research Lab., USA 
Jianchang Mao	 IBM, USA 
Xuedong Huang	 Microsoft Corporation, USA 
Haruo Asada	Toshiba Corporation, Japan 
Jim Keller	          University of Missouri-Columbia, USA 
Kurt Hornik	Technical University of Vienna, Austria 
K K Biswas         Indian Institute of Technology India 
Frederick Jelinek  John Hopkins University, USA 
Adnan Amin	 University of New South Wales, Australia
Jussi Parkkinen	 Lappeenranta University of Technology, Finland 
Hans Guesgen	 University of Aukland, New Zealand
Gregory Hager	 Yale University, USA 
Gerhard Ritter	 University of Florida, USA 
Gabor Herman	 University of Pennsylvania, USA 
Ravi Kothari	 University of Cincinnati, USA 
Tan Chew Lim	 National University of Singapore, Singapore  
Horst Bischof	 Technical University of Vienna, Austria 
Larry Spitz	 Daimler-Benz Research & Tech., USA 
Torfinn Taxt	 University of Bergen, Norway 
Ching Y Suen	 Concordia University, Canada 
Terry Caelli	 Curtin University of Technology, Australia 
Eric Ristad           Princeton University, USA 
Andreas Dengel	 German Research Centre for AI GmbH, Germany 
Henri	Prade	          Universite Paul Sabatier, France 
Alexander Franz	 Sony Computer Science Lab Technology, Japan 
Dan Adam	         Technion-Israel Inst. of Technology, Israel 
John MacIntyre	University of Sunderland, UK 
Robert Duin	 Delft University of Technology, Netherlands 
Hsi-Jian Lee	 National Chiao Tung University, Taiwan 
Steven Salzberg    John Hopkins University, USA 
Ruggero Milanese University of Geneva, Switzerland 
Masayuki Nakajima Tokyo Institute of Technology, Japan 
Melanie Mitchell  Santa Fe Institute, USA 
Madan Singh	  UMIST, UK 
James Duncan	 Yale University, USA 
Sanjoy Mitter	  MIT, USA
Mari Ostendorf    Boston University, USA 
Steve Young	 University of Cambridge, UK 
Alan Bovik	           University of Texas at Austin, USA 
Michael Brady	 University of Oxford, UK 
Simon Kasif	 University of Illinois at Chicago, USA 
David G Stork	 RICOH Silicon Valley, USA
______________________________________________________			

Send your submissions to:
     Sameer Singh
     Editor-in-Chief, Pattern Analysis and Applications
     School of Computing
     University of Plymouth
     Plymouth PL4 8AA
     UK

Full information about the journal and detailed instructions for Call
for Papers can be found at the PAA web site.