Pattern Analysis and Applications

[espaa]

Springer Verlag Ltd is launching a new journal - Pattern Analysis and 
Applications (PAA) - in Spring 1998.

Aims and Scope of PAA:
                                                         
     The journal publishes high quality articles in areas
     of fundamental research in pattern analysis and applications. It
     aims to provide a forum for original research which describes
     novel pattern analysis techniques and industrial applications of
     the current technology. The main aim of the journal is to publish
     high quality research in intelligent pattern analysis in computer
     science and engineering. In addition, the journal will also
     publish articles on pattern analysis applications in medical
     imaging. The journal solicits articles that detail new technology
     and methods for pattern recognition and analysis in applied
     domains including, but not limited to, computer vision and image
     processing, speech analysis, robotics, multimedia, document
     analysis, character recognition, knowledge engineering for
     pattern recognition, fractal analysis, and intelligent control.
     The journal publishes articles on the use of advanced pattern
     recognition and analysis methods including statistical
     techniques, neural networks, genetic algorithms, fuzzy pattern
     recognition, machine learning, and hardware implementations which
     are either relevant to the development of pattern analysis as a
     research area or detail novel pattern analysis applications.
     Papers proposing new classifier systems or their development,
     pattern analysis systems for real-time applications, fuzzy and
     temporal pattern recognition and uncertainty management in
     applied pattern recognition are particularly solicited.

     The journal encourages the submission of original case-studies on
     applied pattern recognition which describe important research in
     the area. The journal also solicits reviews on novel pattern
     analysis benchmarks, evaluation of pattern analysis tools, and
     important research activities at international centres of
     excellence working in pattern analysis.

     Audience:
     Researchers in computer science and engineering. Research and
     Development Personnel in industry. Researchers/ applications
     where pattern analysis is used, researchers in the area of novel
     pattern recognition and analysis techniques and their specific
     applications.

Full information about the journal and detailed instructions for Call 
for Papers can be found at the PAA web site:

http://www.soc.plym.ac.uk/soc/sameer/paa.htm

Best regards

Barbara Davies
School of Computing
University of Plymouth