"Pattern Classification and Scene Analysis"

[David G. Stork]

     I am writing the second edition of "Pattern Classification and Scene
Analysis" (part I) by R. O. Duda and P. E. Hart for Wiley Publishers.  This
second edition will be greatly expanded, to include topics such as neural
networks, stochastic methods (e.g., Boltzmann learning), theory of learning
and generalization (e.g., capacity issues), and many other modern topics.
All figures are being redrawn in high-quality PostScript form, including
many three-dimensional figures illustrating the basic issues.  The homeworks
have been similarly expanded, and computer exercises have been written for
all chapters.
     Wiley has given us permission to release the preliminary manuscript to
educators free of charge, for consideration for distributing to students
(again, at no royalty fee).  There are only a few minor provisos, the
only two of substance is that no one can make a *profit* from distributing
the manuscript, and the copyright must remain on the cover of every set
distributed.
     Six chapters are complete (in draft form) and drafts of the remaining
five should be done by the end of this year.  (Many of the figures are
currently hand drawn, and none appear in the text itself, as of yet.)  Likewise,
references have not been included.  Nevertheless all material from the
First Edition has been included (though in later drafts some of this will
be deleted).
     If you are interested in obtaining a copy of chapters of the manuscript,
contact me and I'll send you (by e-mail) a copy of the Table of Contents.  If
you are still interested in possibly using the text, we can go on from there.

Dr. David G. Stork
Chief Scientist and
Head, Machine Learning and Perception
Ricoh California Research Center
2882 Sand Hill Road  Suite 115
Menlo Park, CA 94025-7022 USA
415-496-5720 (w)
415-854-8740 (fax)
stork at crc.ricoh.com